Journal of Data and Information Science  2017, Vol. 2 Issue (1): 13-50    DOI: 10.1515/jdis-2017-0002
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Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
Anthony F.J. van Raan
Centre for Science and Technology Studies (CWTS), Leiden University, Leiden, the Netherlands

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